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"An accelerated test method of luminous flux depreciation for LED ..."

C. Qian et al. (2016)

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DOI: 10.1016/J.RESS.2015.11.009

access: closed

type: Journal Article

metadata version: 2020-02-25

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  - https://dblp.org/rec/journals/ress/QianFFYZ16
C. Qian, X. J. Fan, J. J. Fan, Cadmus A. Yuan, Guo Qi Zhang:
An accelerated test method of luminous flux depreciation for LED luminaires and lamps. Reliab. Eng. Syst. Saf. 147: 84-92 (2016)

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