"Semi-parametric PWP model robustness for log-linear increasing rates of ..."

Thomas L. Landers, Shwu-Tzy Jiang, Jerry R. Peek (2001)

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DOI: 10.1016/S0951-8320(01)00036-9

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type: Journal Article

metadata version: 2023-09-18

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Thomas L. Landers, Shwu-Tzy Jiang, Jerry R. Peek:
Semi-parametric PWP model robustness for log-linear increasing rates of occurrence of failures. Reliab. Eng. Syst. Saf. 73(2): 145-153 (2001)

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