"Optimal degradation-based burn-in policy using Tweedie ..."

Zhen Chen et al. (2020)

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DOI: 10.1016/J.RESS.2019.106748

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type: Journal Article

metadata version: 2023-08-28

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Zhen Chen, Ershun Pan, Tangbin Xia, Yanting Li:
Optimal degradation-based burn-in policy using Tweedie exponential-dispersion process model with measurement errors. Reliab. Eng. Syst. Saf. 195: 106748 (2020)

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