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"Reliability Estimation for Products Subjected to Two-Stage Degradation ..."
Luis Alberto Rodríguez-Picón et al. (2016)
- Luis Alberto Rodríguez-Picón, Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Arturo Del Valle:
Reliability Estimation for Products Subjected to Two-Stage Degradation Tests Based on a Gamma Convolution. Qual. Reliab. Eng. Int. 32(8): 2901-2908 (2016)
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