"A novel hybrid resampling for semiconductor wafer defect bin classification."

You-Jin Park, Rong Pan, Douglas C. Montgomery (2023)

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DOI: 10.1002/QRE.3217

access: closed

type: Journal Article

metadata version: 2023-02-25

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You-Jin Park, Rong Pan, Douglas C. Montgomery:
A novel hybrid resampling for semiconductor wafer defect bin classification. Qual. Reliab. Eng. Int. 39(1): 67-80 (2023)

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