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"Determination of tolerance limits for the reliability of semiconductor ..."
Vera Hofer et al. (2017)
- Vera Hofer, Johannes Leitner, Horst Lewitschnig, Thomas Nowak:
Determination of tolerance limits for the reliability of semiconductor devices using longitudinal data. Qual. Reliab. Eng. Int. 33(8): 2673-2683 (2017)
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