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"Reliability Model for Electronic Devices under Time Varying Voltage."
Luis Carlos Méndez González et al. (2016)
- Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Delia J. Valles-Rosales, Arturo Del Valle, Arnoldo Rodriguez:
Reliability Model for Electronic Devices under Time Varying Voltage. Qual. Reliab. Eng. Int. 32(4): 1295-1306 (2016)
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