"Reliability Model for Electronic Devices under Time Varying Voltage."

Luis Carlos Méndez-González et al. (2016)

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DOI: 10.1002/QRE.1867

access: closed

type: Journal Article

metadata version: 2024-11-08

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Luis Carlos Méndez-González, Manuel Iván Rodríguez-Borbón, Delia J. Valles-Rosales, Arturo Del Valle, Arnoldo Rodriguez:
Reliability Model for Electronic Devices under Time Varying Voltage. Qual. Reliab. Eng. Int. 32(4): 1295-1306 (2016)

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