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"Reliability analysis for electronic devices using beta-Weibull distribution."
Luis Carlos Méndez González et al. (2017)
- Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón, Delia J. Valles-Rosales, Roberto Romero-López, Abel Eduardo Quezada-Carreón:
Reliability analysis for electronic devices using beta-Weibull distribution. Qual. Reliab. Eng. Int. 33(8): 2521-2530 (2017)
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