"A Dependent Competing Risks Model for Technological Units Subject to ..."

Ji Hwan Cha, Gianpaolo Pulcini (2016)

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DOI: 10.1002/QRE.1767

access: closed

type: Journal Article

metadata version: 2020-07-09

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Ji Hwan Cha, Gianpaolo Pulcini:
A Dependent Competing Risks Model for Technological Units Subject to Degradation Phenomena and Catastrophic Failures. Qual. Reliab. Eng. Int. 32(2): 505-517 (2016)

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