"Robust inference for one-shot device testing data under exponential ..."

Narayanaswamy Balakrishnan et al. (2020)

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DOI: 10.1002/QRE.2665

access: closed

type: Journal Article

metadata version: 2023-08-28

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Narayanaswamy Balakrishnan, Elena Castilla, Nirian Martín, Leandro Pardo:
Robust inference for one-shot device testing data under exponential lifetime model with multiple stresses. Qual. Reliab. Eng. Int. 36(6): 1916-1930 (2020)

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