"Robust inference for nondestructive one-shot device testing under ..."

Narayanaswamy Balakrishnan et al. (2023)

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DOI: 10.1002/QRE.3287

access: open

type: Journal Article

metadata version: 2024-06-08

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Narayanaswamy Balakrishnan, Elena Castilla, María Jaenada, Leandro Pardo:
Robust inference for nondestructive one-shot device testing under step-stress model with exponential lifetimes. Qual. Reliab. Eng. Int. 39(4): 1192-1222 (2023)

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