"Attacking NIST biometric image software using nonlinear optimization."

Sunny Raj et al. (2020)

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DOI: 10.1016/J.PATREC.2019.12.003

access: closed

type: Journal Article

metadata version: 2023-09-30

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Sunny Raj, Jodh S. Pannu, Steven Lawrence Fernandes, Arvind Ramanathan, Laura L. Pullum, Sumit Kumar Jha:
Attacking NIST biometric image software using nonlinear optimization. Pattern Recognit. Lett. 131: 79-84 (2020)

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