"Global registration of overlapping images using accumulative image features."

Karthik Krish et al. (2010)

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DOI: 10.1016/J.PATREC.2009.09.016

access: closed

type: Journal Article

metadata version: 2020-02-22

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Karthik Krish, Stuart B. Heinrich, Wesley E. Snyder, Halil Cakir, Siamak Khorram:
Global registration of overlapping images using accumulative image features. Pattern Recognit. Lett. 31(2): 112-118 (2010)

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