"Good recognition is non-metric."

Walter J. Scheirer et al. (2014)

> Home

Details and statistics

DOI: 10.1016/J.PATCOG.2014.02.018

access: closed

type: Journal Article

metadata version: 2020-02-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/pr/ScheirerWEB14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/pr/ScheirerWEB14
Walter J. Scheirer, Michael J. Wilber, Michael Eckmann, Terrance E. Boult:
Good recognition is non-metric. Pattern Recognit. 47(8): 2721-2731 (2014)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.