"A Survey of Test and Reliability Solutions for Magnetic Random Access ..."

Patrick Girard et al. (2021)

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DOI: 10.1109/JPROC.2020.3029600

access: closed

type: Journal Article

metadata version: 2021-03-23

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Patrick Girard, Yuanqing Cheng, Arnaud Virazel, Wei Zhao, Rajendra Bishnoi, Mehdi B. Tahoori:
A Survey of Test and Reliability Solutions for Magnetic Random Access Memories. Proc. IEEE 109(2): 149-169 (2021)

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