"ESD: a pervasive reliability concern for IC technologies."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Charvaka Duvvury, Ajith Amerasekera (1993)

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DOI: 10.1109/5.220901

access: closed

type: Journal Article

metadata version: 2022-08-16

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Charvaka Duvvury, Ajith Amerasekera:
ESD: a pervasive reliability concern for IC technologies. Proc. IEEE 81(5): 690-702 (1993)

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