"Trapping effects in GaN and SiC microwave FETs."

Steven C. Binari, P. B. Klein, Thomas E. Kazior (2002)

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DOI: 10.1109/JPROC.2002.1021569

access: closed

type: Journal Article

metadata version: 2021-08-17

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Steven C. Binari, P. B. Klein, Thomas E. Kazior:
Trapping effects in GaN and SiC microwave FETs. Proc. IEEE 90(6): 1048-1058 (2002)

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