"Automatic test pattern generation on parallel processors."

Sunil Arvindam et al. (1991)

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DOI: 10.1016/S0167-8191(05)80001-8

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type: Journal Article

metadata version: 2022-04-29

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Sunil Arvindam, Vipin Kumar, V. Nageshwara Rao, Vineet Singh:
Automatic test pattern generation on parallel processors. Parallel Comput. 17(12): 1323-1342 (1991)

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