"Improving Deep Metric Learning by Divide and Conquer."

Artsiom Sanakoyeu et al. (2022)

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DOI: 10.1109/TPAMI.2021.3113270

access: closed

type: Journal Article

metadata version: 2022-10-18

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Artsiom Sanakoyeu, Pingchuan Ma, Vadim Tschernezki, Björn Ommer:
Improving Deep Metric Learning by Divide and Conquer. IEEE Trans. Pattern Anal. Mach. Intell. 44(11): 8306-8320 (2022)

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