"Pores and Ridges: High-Resolution Fingerprint Matching Using Level 3 Features."

Anil K. Jain, Yi Chen, Meltem Demirkus (2007)

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DOI: 10.1109/TPAMI.2007.250596

access: closed

type: Journal Article

metadata version: 2019-07-01

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  - https://dblp.org/rec/journals/pami/JainCD07
Anil K. Jain, Yi Chen, Meltem Demirkus:
Pores and Ridges: High-Resolution Fingerprint Matching Using Level 3 Features. IEEE Trans. Pattern Anal. Mach. Intell. 29(1): 15-27 (2007)

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