"Class-Wise Denoising for Robust Learning Under Label Noise."

Chen Gong et al. (2023)

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DOI: 10.1109/TPAMI.2022.3178690

access: closed

type: Journal Article

metadata version: 2023-02-25

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Chen Gong, Yongliang Ding, Bo Han, Gang Niu, Jian Yang, Jane You, Dacheng Tao, Masashi Sugiyama:
Class-Wise Denoising for Robust Learning Under Label Noise. IEEE Trans. Pattern Anal. Mach. Intell. 45(3): 2835-2848 (2023)

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