"Binary Classifiers for Data Integrity Detection in Wearable IoT Edge Devices."

Arlene John et al. (2020)

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DOI: 10.1109/OJCAS.2020.3009520

access: open

type: Journal Article

metadata version: 2023-01-29

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Arlene John, Rajesh C. Panicker, Barry Cardiff, Yong Lian, Deepu John:
Binary Classifiers for Data Integrity Detection in Wearable IoT Edge Devices. IEEE Open J. Circuits Syst. 1: 88-99 (2020)

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