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"Binary Classifiers for Data Integrity Detection in Wearable IoT Edge Devices."
Arlene John et al. (2020)
- Arlene John, Rajesh C. Panicker, Barry Cardiff, Yong Lian, Deepu John:
Binary Classifiers for Data Integrity Detection in Wearable IoT Edge Devices. IEEE Open J. Circuits Syst. 1: 88-99 (2020)
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