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"Comparing test-retest reliability of dynamic functional connectivity methods."

Ann S. Choe et al. (2017)

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DOI: 10.1016/J.NEUROIMAGE.2017.07.005

access: closed

type: Journal Article

metadata version: 2021-04-09

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  - journals/neuroimage/ChoeNBCXPCL17
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  - https://dblp.org/rec/journals/neuroimage/ChoeNBCXPCL17
Ann S. Choe, Mary Beth Nebel, Anita D. Barber, Jessica R. Cohen, Yuting Xu, James J. Pekar, Brian Caffo, Martin A. Lindquist:
Comparing test-retest reliability of dynamic functional connectivity methods. NeuroImage 158: 155-175 (2017)

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