"A fast regularity measure for surface defect detection."

Du-Ming Tsai et al. (2012)

> Home

Details and statistics

DOI: 10.1007/S00138-011-0403-3

access: closed

type: Journal Article

metadata version: 2017-05-17

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mva/TsaiCLC12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mva/TsaiCLC12
Du-Ming Tsai, Ming-Chun Chen, Wei-Chen Li, Wei-Yao Chiu:
A fast regularity measure for surface defect detection. Mach. Vis. Appl. 23(5): 869-886 (2012)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.