"Detection of oxidation region of flexible integrated circuit substrate ..."

Zhiyan Zhong, Yueming Hu (2019)

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DOI: 10.1007/S11042-018-6466-7

access: closed

type: Journal Article

metadata version: 2021-12-20

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Zhiyan Zhong, Yueming Hu:
Detection of oxidation region of flexible integrated circuit substrate based on topology mapping. Multim. Tools Appl. 78(6): 7871-7892 (2019)

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