"Investigation of read disturb in split-gate memory and its feasible solution."

Wenyi Zhu et al. (2017)

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DOI: 10.1016/J.MICROREL.2016.11.009

access: closed

type: Journal Article

metadata version: 2020-02-22

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Wenyi Zhu, Binghan Li, Tao Yu, Weiran Kong, Shichang Zou:
Investigation of read disturb in split-gate memory and its feasible solution. Microelectron. Reliab. 68: 51-56 (2017)

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