"Dielectric charging induced drift in micro device reliability-a review."

Wu Zhou et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.09.004

access: closed

type: Journal Article

metadata version: 2023-04-19

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Wu Zhou, Jiangbo He, Xiao-Ping He, Huijun Yu, Bei Peng:
Dielectric charging induced drift in micro device reliability-a review. Microelectron. Reliab. 66: 1-9 (2016)

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