"Single-event multiple transients in guard-ring hardened inverter chains of ..."

Wen Zhao et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.06.014

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type: Journal Article

metadata version: 2025-01-19

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Wen Zhao, Chaohui He, Wei Chen, Rongmei Chen, Peitian Cong, Fengqi Zhang, Zujun Wang, Chen Shen, Lisang Zheng, Xiaoqiang Guo, Lili Ding:
Single-event multiple transients in guard-ring hardened inverter chains of different layout designs. Microelectron. Reliab. 87: 151-157 (2018)

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