"Investigation on hot-carrier-induced degradation of SOI NLIGBT."

Shifeng Zhang et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.02.009

access: closed

type: Journal Article

metadata version: 2020-02-22

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Shifeng Zhang, Yan Han, Koubao Ding, Bin Zhang, Jiaxian Hu:
Investigation on hot-carrier-induced degradation of SOI NLIGBT. Microelectron. Reliab. 51(6): 1097-1104 (2011)

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