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"High field stress at and above room temperature in 2.3 nm thick oxides."
Damien Zander et al. (2001)
- Damien Zander, Christian Petit, F. Saigné, A. Meinertzhagen:
High field stress at and above room temperature in 2.3 nm thick oxides. Microelectron. Reliab. 41(7): 1023-1026 (2001)
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