"Hot electron induced punchthrough voltage of p-channel SOI MOSFET's at ..."

Se Re Na Yun et al. (2003)

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DOI: 10.1016/S0026-2714(03)00262-2

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type: Journal Article

metadata version: 2022-04-22

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Se Re Na Yun, Won Sub Park, Byung Ha Lee, Jong Tae Park:
Hot electron induced punchthrough voltage of p-channel SOI MOSFET's at room and elevated temperatures. Microelectron. Reliab. 43(9-11): 1477-1482 (2003)

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