"Study of performance degradations in DC-DC converter due to hot carrier ..."

Chuanzhao Yu, L. Jiang, Jiann-Shiun Yuan (2006)

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DOI: 10.1016/J.MICROREL.2006.07.079

access: closed

type: Journal Article

metadata version: 2020-02-22

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Chuanzhao Yu, L. Jiang, Jiann-Shiun Yuan:
Study of performance degradations in DC-DC converter due to hot carrier stress by simulation. Microelectron. Reliab. 46(9-11): 1840-1843 (2006)

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