"RF stress effects on CMOS LC-loaded VCO reliability evaluated by experiments."

H. D. Yen et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.04.007

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type: Journal Article

metadata version: 2024-01-19

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H. D. Yen, Jiann-Shiun Yuan, Ruey-Lue Wang, G. W. Huang, W. K. Yeh, F. S. Huang:
RF stress effects on CMOS LC-loaded VCO reliability evaluated by experiments. Microelectron. Reliab. 52(11): 2655-2659 (2012)

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