"Manufacturing process-based storage degradation modelling and reliability ..."

Xuerong Ye et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.06.085

access: closed

type: Journal Article

metadata version: 2020-02-22

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Xuerong Ye, Yigang Lin, Qingmin Wang, Hao Niu, Guofu Zhai:
Manufacturing process-based storage degradation modelling and reliability assessment. Microelectron. Reliab. 88-90: 107-110 (2018)

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