"Effect of high temperature aging on reliability of automotive electronics."

Dao-Guo Yang et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.07.075

access: closed

type: Journal Article

metadata version: 2020-02-22

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Dao-Guo Yang, F. F. Wan, Z. Y. Shou, Willem D. van Driel, H. Scholten, L. Goumans, Roberto Faria:
Effect of high temperature aging on reliability of automotive electronics. Microelectron. Reliab. 51(9-11): 1938-1942 (2011)

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