"Failure rate estimation of known failure mechanisms of electronic packages."

Liyu Yang, Joseph B. Bernstein (2009)

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DOI: 10.1016/J.MICROREL.2009.06.005

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type: Journal Article

metadata version: 2023-09-30

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Liyu Yang, Joseph B. Bernstein:
Failure rate estimation of known failure mechanisms of electronic packages. Microelectron. Reliab. 49(12): 1563-1572 (2009)

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