"Recovery behaviors in n-channel LTPS-TFTs under DC stress."

Wei Yan et al. (2018)

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DOI: 10.1016/J.MICROREL.2017.12.026

access: closed

type: Journal Article

metadata version: 2020-02-22

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Wei Yan, Zhinong Yu, Jian Guo, Dawei Shi, Jianshe Xue, Wei Xue:
Recovery behaviors in n-channel LTPS-TFTs under DC stress. Microelectron. Reliab. 81: 117-120 (2018)

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