"Degradation properties of MOVPE-grown GaInP/GaAs HBTs under combined ..."

Joachim Würfl et al. (2001)

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DOI: 10.1016/S0026-2714(01)00081-6

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type: Journal Article

metadata version: 2021-10-14

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Joachim Würfl, Paul Kurpas, Frank Brunner, Michael Mai, Matthias Rudolph, Markus Weyers:
Degradation properties of MOVPE-grown GaInP/GaAs HBTs under combined temperature and current stressing. Microelectron. Reliab. 41(8): 1103-1108 (2001)

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