"Leakage current study and relevant defect localization in integrated ..."

Chunlei Wu, Suying Yao, Corinne Bergès (2015)

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DOI: 10.1016/J.MICROREL.2015.01.005

access: closed

type: Journal Article

metadata version: 2020-02-22

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Chunlei Wu, Suying Yao, Corinne Bergès:
Leakage current study and relevant defect localization in integrated circuit failure analysis. Microelectron. Reliab. 55(3-4): 463-469 (2015)

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