"Comparative studies on microelectronic reliability issue of Sn whisker ..."

Jie Wu et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.10.020

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type: Journal Article

metadata version: 2020-02-22

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Jie Wu, Songbai Xue, Jingwen Wang, Jianxin Wang:
Comparative studies on microelectronic reliability issue of Sn whisker growth in Sn-0.3Ag-0.7Cu-1Pr solder under different environments. Microelectron. Reliab. 79: 124-135 (2017)

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