"The degradation mechanisms in high voltage pLEDMOS transistor with thick ..."

Hong Wu et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.09.002

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type: Journal Article

metadata version: 2020-02-22

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Hong Wu, Weifeng Sun, Yangbo Yi, Haisong Li, Longxing Shi:
The degradation mechanisms in high voltage pLEDMOS transistor with thick gate oxide. Microelectron. Reliab. 48(11-12): 1804-1808 (2008)

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