"Electrically induced physical damage (EIPD) cases study: From electrical ..."

Chunlei Wu (2018)

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DOI: 10.1016/J.MICROREL.2018.07.011

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type: Journal Article

metadata version: 2020-02-22

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Chunlei Wu:
Electrically induced physical damage (EIPD) cases study: From electrical overstress (EOS) to product defects. Microelectron. Reliab. 88-90: 203-207 (2018)

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