"Erratum to "Determining factors affecting ESD failure voltage using DOE" ..."

Charles S. Whitman et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.08.016

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type: Journal Article

metadata version: 2020-02-22

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Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell:
Erratum to "Determining factors affecting ESD failure voltage using DOE" [Microelectron. Reliability 46 (2006) 1228-1237]. Microelectron. Reliab. 46(12): 2160 (2006)

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