"Test methodology of a new upset mechanism induced by protons in deep ..."

Cécile Weulersse et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.06.076

access: closed

type: Journal Article

metadata version: 2021-03-30

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Cécile Weulersse, Florent Miller, Dan Alexandrescu, Erwin Schaefer, Olivier Crépel, Rémi Gaillard:
Test methodology of a new upset mechanism induced by protons in deep sub-micron devices. Microelectron. Reliab. 52(9-10): 2482-2486 (2012)

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