"A generalized degradation model based on Gaussian process."

Zhihua Wang et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.05.001

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type: Journal Article

metadata version: 2025-01-19

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Zhihua Wang, Qiong Wu, Xiongjian Zhang, Xinlei Wen, Yongbo Zhang, Chengrui Liu, Huimin Fu:
A generalized degradation model based on Gaussian process. Microelectron. Reliab. 85: 207-214 (2018)

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