"Degradation testing and failure analysis of DC film capacitors under high ..."

Huai Wang, Dennis A. Nielsen, Frede Blaabjerg (2015)

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DOI: 10.1016/J.MICROREL.2015.06.011

access: closed

type: Journal Article

metadata version: 2020-02-22

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Huai Wang, Dennis A. Nielsen, Frede Blaabjerg:
Degradation testing and failure analysis of DC film capacitors under high humidity conditions. Microelectron. Reliab. 55(9-10): 2007-2011 (2015)

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