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"Corrigendum to "A subgap density of states modeling for the transient ..."
Weiliang Wang et al. (2016)
- Weiliang Wang, Karim Khan, Xingye Zhang, Haiming Qin, Jun Jiang, Lijing Miao, Kemin Jiang, Pengjun Wang, Mingzhi Dai, Junhao Chu:
Corrigendum to "A subgap density of states modeling for the transient characteristics in oxide-based thin-film transistors" [Microelectron. Reliab. 60 (2016) 67-69]. Microelectron. Reliab. 67: 159 (2016)
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