"Tensile CESL-induced strain dependence on impact ionization efficiency in ..."

Bo-Chin Wang et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.01.028

access: closed

type: Journal Article

metadata version: 2020-02-22

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Bo-Chin Wang, Ting-Kuo Kang, San-Lein Wu, Shoou-Jinn Chang:
Tensile CESL-induced strain dependence on impact ionization efficiency in nMOSFETs. Microelectron. Reliab. 50(5): 610-613 (2010)

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