"Defects evolution involving interface dispersion approaches in ..."

Yasmin Abdul Wahab, Norhayati Soin, Sharifah Wan Muhamad Hatta (2014)

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DOI: 10.1016/J.MICROREL.2014.07.084

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yasmin Abdul Wahab, Norhayati Soin, Sharifah Wan Muhamad Hatta:
Defects evolution involving interface dispersion approaches in high-k/metal-gate deep-submicron CMOS. Microelectron. Reliab. 54(9-10): 2334-2338 (2014)

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