"Predictive modeling of board level shock-impact reliability of the ..."

J. de Vries, W. Balemans, W. D. van Driel (2010)

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DOI: 10.1016/J.MICROREL.2009.10.015

access: closed

type: Journal Article

metadata version: 2020-02-22

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J. de Vries, W. Balemans, W. D. van Driel:
Predictive modeling of board level shock-impact reliability of the HVQFN-family. Microelectron. Reliab. 50(2): 228-234 (2010)

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